PCA and K-means clustering applied to Raman and PL imaging reveal structural defects in silicon wafers, enhancing understanding of optoelectronic performance.

1 Department of Computer and Instructional Technologies Education, Gazi Faculty of Education, Gazi University, Ankara, Türkiye. 2 Department of Forensic Informatics, Institute of Informatics, Gazi ...

So, you want to get better at those tricky LeetCode Python problems, huh? It’s a common goal, especially if you’re aiming for tech jobs. Many people try to just grind through tons of problems, but ...